Ed Averill

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Revision as of 04:43, 17 March 2025 by Peter (talk | contribs) (Created page with "{{Person |Names=Edward E. Averill |Affiliations=University of Nebraska;Tektronix; }} {{MissingBio}} From Tekscope V12 N2 1980: <blockquote>Ed Averill joined Tektronix three years ago after completing his BSEE and a year of postgraduate studies at the University of Nebraska. His work on the 308 included evaluation of both electrical and firmware design, which entailed spending three months in Japan. [...]</blockquote> ==Links== {{Doc...")
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Edward E. Averill (? – ?)

   Please add referenced biography.

From Tekscope V12 N2 1980:

Ed Averill joined Tektronix three years ago after completing his BSEE and a year of postgraduate studies at the University of Nebraska. His work on the 308 included evaluation of both electrical and firmware design, which entailed spending three months in Japan. [...]

Links

Documents Authored by Ed Averill

Document Page Class Title Author(s) Year Refers to
Tekscope 1980 V12 N2.pdf 3 Article Portable Analyzer Speeds Test and Service of Microprocessor-Based System Ed Averill John Huber 1980 308

Products by Ed Averill

Components by Ed Averill

Patents by Edward E. Averill

Page Office Number Title Inventors Company Filing date Grant date
Patent US 5387896A US 5387896 Rasterscan display with adaptive decay Kuriappan P. Alappat Edward E. Averill Tektronix Inc 1990-08-06 1995-02-07