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• 05:55, 20 March 2024 Peter talk contribs created page Patent US 6246717B1 (Created page with "{{Patent |Office=US |Number=6246717B1 |Title=Measurement test set and method for in-service measurements of phase noise |Company=Tektronix Inc |Inventors=Xiaofen Chen;Linley Gumm;Dana E. Whitlow;Larry Lockwood |Filing date=1998-11-03 |Grant date=2001-06-12 }}")