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571: Difference between revisions
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Deanhuster (talk | contribs) m (Corrected manual description and added an Instruction Manual upload need.) |
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discontinued=1995 | | discontinued=1995 | | ||
manuals= | manuals= | ||
* [http://w140.com/tek_571.pdf Tektronix 571 Manual (PDF)] | * [http://w140.com/tek_571.pdf Tektronix 571 Operator's Manual (PDF)] | ||
* "Instruction Manual" (Operator's + Service) or "Service Manual" needed | |||
[[Category:Manual needed]] | |||
}} | }} | ||
The '''Tektronix 571''' is a curve tracer. It can show the characteristic curves of PNP and NPN bipolar transistors, both N- and P-channel FETs, diodes (including Zener types), and SCRs. It is a microprocessor-controlled device, and user interaction is done through navigation keys. A typical sweep run takes about five seconds. It has a parallel printer output that can print graphics on Epson-protocol dot-matrix printers. | The '''Tektronix 571''' is a [[:Category:Curve tracers|curve tracer]]. It can show the characteristic curves of PNP and NPN bipolar transistors, both N- and P-channel FETs, diodes (including Zener types), and SCRs. It is a microprocessor-controlled device, and user interaction is done through navigation keys. A typical sweep run takes about five seconds. It has a parallel printer output that can print graphics on Epson-protocol dot-matrix printers. | ||
One nice feature of the 571 is its ability to store a set of ''reference'' curves, which are displayed as a background for subsequent measurement runs. This makes comparison and matching between devices easy. | One nice feature of the 571 is its ability to store a set of ''reference'' curves, which are displayed as a background for subsequent measurement runs. This makes comparison and matching between devices easy. | ||
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Because the nature of electronic component testing involves exposing components to sometimes hazardous voltages and operating conditions, at certain settings the 571 will refuse to start a measurement cycle until the user lowers the built-in hinged plastic shield over the socket area. This is to protect the user from both high voltage and high-velocity flying debris in the event of a catastrophic component failure during a test run. The shield is made of a thick high-impact plastic, and the 571 has an internal microswitch so its firmware knows if the shield is in the up or down position. | Because the nature of electronic component testing involves exposing components to sometimes hazardous voltages and operating conditions, at certain settings the 571 will refuse to start a measurement cycle until the user lowers the built-in hinged plastic shield over the socket area. This is to protect the user from both high voltage and high-velocity flying debris in the event of a catastrophic component failure during a test run. The shield is made of a thick high-impact plastic, and the 571 has an internal microswitch so its firmware knows if the shield is in the up or down position. | ||
==Specifications== | ==Specifications== | ||