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S-3130: Difference between revisions
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The '''Tektronix S-3130''' and its variants S-3131 and S-3132 were automatic measurement systems for device characterization and testing. | The '''Tektronix S-3130''' and its variants S-3131 and S-3132 were automatic measurement systems for device characterization and testing. | ||
The S-3130 included a [[R568]] oscilloscope with [[3S6]]/[[3T6]] sampling plugins, a pair of [[S-3]] sampling heads, two probe choppers, an [[R240]] program control unit, [[R250]] auxiliary program unit, [[R116]] programmable pulse generator, four programmable power supplies (one ±80 V, three ±40 V) a disc memory (not in 3131) and a paper tape reader (not in 3132). The instruments were mounted in a twin 19" rack with an operator table on the side. | The S-3130 included a [[R568]] oscilloscope with [[3S6]]/[[3T6]] sampling plugins, | ||
a pair of [[S-3]] sampling heads, two probe choppers, an [[R240]] program control unit, | |||
[[R250]] auxiliary program unit, [[R116]] programmable pulse generator, | |||
four programmable power supplies (one ±80 V, three ±40 V) a disc memory (not in 3131) and a paper tape reader (not in 3132). | |||
The instruments were mounted in a twin 19" rack with an operator table on the side. | |||
* [[Media:Tek s-3130 ocr.pdf|Tektronix S-3130 Manual (PDF)]] | |||
* [http://w140.com/tek_s-3130_1968_cat.pdf Tektronix S-3130 in 1968 Catalog (PDF)] | * [http://w140.com/tek_s-3130_1968_cat.pdf Tektronix S-3130 in 1968 Catalog (PDF)] | ||
[[Category:Automatic Test Systems]] | [[Category:Automatic Test Systems]] | ||