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567: Difference between revisions
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* [http://bama.edebris.com/download/tek/567/tek%20567.v6.pdf | * [[Media:070-0322-01.pdf|Tektronix 567 Manual]] (PDF) / [http://bama.edebris.com/download/tek/567/tek%20567.v6.pdf @ BAMA] | ||
* [http://w140.com/4499749_tek567.pdf Materials Characterization Application of 567 (PDF)] | * [http://w140.com/4499749_tek567.pdf Materials Characterization Application of 567 (PDF)] | ||
* [http://w140.com/tek_567_1968_catalog.pdf Tektronix 567 in 1968 Catalog (PDF)] | * [http://w140.com/tek_567_1968_catalog.pdf Tektronix 567 in 1968 Catalog (PDF)] | ||
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The '''Tektronix 567''' is a [[sampling oscilloscope]] mainframe [[introduced in 1962]]. | The '''Tektronix 567''' is a [[sampling oscilloscope]] mainframe [[introduced in 1962]]. | ||
It has a digital plug-in unit, the [[6R1]] or [[6R1A]], that can be used to measure | It has a digital plug-in unit, the [[6R1]] or [[6R1A]], that can be used to measure waveform characteristics such as rise time. | ||
waveform characteristics such as rise time. This digital unit provides a go/no-go output | This digital unit provides a go/no-go output based on waveform characteristics. | ||
based on waveform characteristics. This feature makes the 567 particularly useful in | This feature makes the 567 particularly useful in production testing for tasks such as binning logic gates based on their speed. | ||
production testing for tasks such as binning logic gates based on their speed. | |||
The development of the 567 (and 6R1) was led by [[Sam McCutcheon]]. | The development of the 567 (and 6R1) was led by [[Sam McCutcheon]]. | ||