Patent US 4677340A: Difference between revisions
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|Filing date=1984-12-24 | |Filing date=1984-12-24 | ||
|Grant date=1987-06-30 | |Grant date=1987-06-30 | ||
|Links=11301; | |Links=11301;11301A;11302;11302A; | ||
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In the 11301/11302 scopes, optical sensors on the CRT bezel sense when the beam crosses the graticule lines to factor this information into the auto cal control signals. As a result, accuracy of the 11300-Series is controlled from the plug-in input connector to the CRT graticule without operator intervention. | |||
Latest revision as of 00:06, 11 September 2024
| Patent number | US 4677340A (click link for details and documents via Google Patents) |
|---|---|
| Title | Method and apparatus for calibrating deflection in an oscilloscope |
| Inventors | Lawrence J. Miller, Donald P. Chitwood |
| Company | Tektronix Inc |
| Filing date | 1984-12-24 |
| Grant date | 1987-06-30 |
Related products:
| Manufacturer | Model | Description | Introduced | Designers |
|---|---|---|---|---|
| Tektronix | 11301 | 400 MHz programmable analog scope | 1986 | |
| Tektronix | 11302 | 500 MHz analog micro-channel scope | 1986 | |
| Tektronix | 11302A | 500 MHz analog micro-channel scope | 1989 |
In the 11301/11302 scopes, optical sensors on the CRT bezel sense when the beam crosses the graticule lines to factor this information into the auto cal control signals. As a result, accuracy of the 11300-Series is controlled from the plug-in input connector to the CRT graticule without operator intervention.