Patent US 4677340A: Difference between revisions
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|Filing date=1984-12-24 | |Filing date=1984-12-24 | ||
|Grant date=1987-06-30 | |Grant date=1987-06-30 | ||
|Links=11301;11301A;11302;11302A; | |||
}} | }} | ||
In the 11301/11302 scopes, optical sensors on the CRT bezel sense when the beam crosses the graticule lines to factor this information into the auto cal control signals. As a result, accuracy of the 11300-Series is controlled from the plug-in input connector to the CRT graticule without operator intervention. |
Latest revision as of 00:06, 11 September 2024
Patent number | US 4677340A (click link for details and documents via Google Patents) |
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Title | Method and apparatus for calibrating deflection in an oscilloscope |
Inventors | Lawrence J. Miller, Donald P. Chitwood |
Company | Tektronix Inc |
Filing date | 1984-12-24 |
Grant date | 1987-06-30 |
Related products:
Manufacturer | Model | Description | Introduced | Designers |
---|---|---|---|---|
Tektronix | 11301 | 400 MHz programmable analog scope | 1986 | |
Tektronix | 11302 | 500 MHz analog micro-channel scope | 1986 | |
Tektronix | 11302A | 500 MHz analog micro-channel scope | 1989 |
In the 11301/11302 scopes, optical sensors on the CRT bezel sense when the beam crosses the graticule lines to factor this information into the auto cal control signals. As a result, accuracy of the 11300-Series is controlled from the plug-in input connector to the CRT graticule without operator intervention.