Patent US 4677340A

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Patent number US 4677340A (click link for details and documents via Google Patents)
Title Method and apparatus for calibrating deflection in an oscilloscope
Inventors Lawrence J. Miller, Donald P. Chitwood
Company Tektronix Inc
Filing date 1984-12-24
Grant date 1987-06-30


Related products:

Manufacturer Model Description Introduced Designers
Tektronix 11301 400 MHz programmable analog scope 1986
Tektronix 11302 500 MHz analog micro-channel scope 1986
Tektronix 11302A 500 MHz analog micro-channel scope 1989


In the 11301/11302 scopes, optical sensors on the CRT bezel sense when the beam crosses the graticule lines to factor this information into the auto cal control signals. As a result, accuracy of the 11300-Series is controlled from the plug-in input connector to the CRT graticule without operator intervention.