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* [http://w140.com/frye_subnanosecond_pulse_gen.pdf ''A Predictable Subnanosecond Step Generator.''] IEEE Trans. Instrum. Meas. Vol. IM17 No. 4 (Dec 1968)''. IEEE Trans. Instrum. Meas. Vol. IM17 No. 4 (Dec 1968) | * [http://w140.com/frye_subnanosecond_pulse_gen.pdf ''A Predictable Subnanosecond Step Generator.''] IEEE Trans. Instrum. Meas. Vol. IM17 No. 4 (Dec 1968)''. IEEE Trans. Instrum. Meas. Vol. IM17 No. 4 (Dec 1968) | ||
* [[Media:062-1244-00.pdf | Time-Domain Reflectometry Measurements]], 1973 (contrib.) | * [[Media:062-1244-00.pdf | Time-Domain Reflectometry Measurements]], 1973 (contrib.) | ||
* [https://www.google.com/patents/US3281705 US Pat. 3281705, Wide band signal inverter circuit having separate paths for high and low frequency signal portions]. Filed Feb 1964. | |||
* [https://www.google.com/patents/US3434049 US Pat. 3434049, Time domain reflectometry system having a current source for locating discontinuities in a transmission line]. Filed Dec 1965. | * [https://www.google.com/patents/US3434049 US Pat. 3434049, Time domain reflectometry system having a current source for locating discontinuities in a transmission line]. Filed Dec 1965. | ||
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