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* Designed [[S-4|S-4 Sampling Head]] (1968-1990) | * Designed [[S-4|S-4 Sampling Head]] (1968-1990) | ||
==Publications== | ==Publications and Patents== | ||
* [http://w140.com/frye_s4_gate.pdf A new Approach to Fast Gate Design] (also in [[Media:Service Scope 52 Oct 1968.pdf | Servicescope No. 52, Oct 1968]]) | * [http://w140.com/frye_s4_gate.pdf A new Approach to Fast Gate Design] (also in [[Media:Service Scope 52 Oct 1968.pdf | Servicescope No. 52, Oct 1968]]) | ||
* [http://w140.com/frye_subnanosecond_pulse_gen.pdf ''A Predictable Subnanosecond Step Generator.''] IEEE Trans. Instrum. Meas. Vol. IM17 No. 4 (Dec 1968)''. IEEE Trans. Instrum. Meas. Vol. IM17 No. 4 (Dec 1968) | * [http://w140.com/frye_subnanosecond_pulse_gen.pdf ''A Predictable Subnanosecond Step Generator.''] IEEE Trans. Instrum. Meas. Vol. IM17 No. 4 (Dec 1968)''. IEEE Trans. Instrum. Meas. Vol. IM17 No. 4 (Dec 1968) | ||
* [[Media:062-1244-00.pdf | Time-Domain Reflectometry Measurements]], 1973 (contrib.) | * [[Media:062-1244-00.pdf | Time-Domain Reflectometry Measurements]], 1973 (contrib.) | ||
* [https://www.google.com/patents/US3434049 US Pat. 3434049, Time domain reflectometry system having a current source for locating discontinuities in a transmission line]. Filed Dec 1965. | |||
* ... please add ... | |||
* [https://www.google.com/patents/US8995674 US Pat. 8995674, Multiple superimposed audio frequency test system and sound chamber with attenuated echo properties]. Filed May 2012. | |||
==Links and References== | ==Links and References== |