S-3100: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
No edit summary |
||
Line 1: | Line 1: | ||
{{Instrument Sidebar | |||
|manufacturer=Tektronix | |||
|model=S-3100 | |||
|class=Signal processing system | |||
|series= | |||
|summary=Signal processing system | |||
|image=Tek s-3100.jpg | |||
|caption=Tektronix S-3100 Signal processing system (Photo from 1968 Catalog) | |||
|introduced=1967 | |||
|discontinued=(?) | |||
|designers= | |||
|manuals= | |||
* ''please add'' [[Category:Manual needed]] | |||
}} | |||
The '''Tektronix S-3100''' is a family of automated test systems, introduced at WESCON in July 1967. | The '''Tektronix S-3100''' is a family of automated test systems, introduced at WESCON in July 1967. | ||
They use a package consisting of a [[568|568 programmable readout oscilloscope]], | They use a package consisting of a [[568|568 programmable readout oscilloscope]], dual channel vertical sampling plug-ins ([[3S5]]/[[3S6]]), and delaying sweep time bases ([[3T5]]/[[3T6]]), plus a digital readout unit ([[230]]). | ||
dual channel vertical sampling plug-ins ([[3S5]]/[[3S6]]), | |||
and delaying sweep time bases ([[3T5]]/[[3T6]]), plus a digital readout unit ([[230]]). | |||
==Link== | ==Link== | ||
* [[Media:S-3100 Series Brochure.pdf|S-3100 Series Brochure (PDF)]] | * [[Media:S-3100 Series Brochure.pdf|S-3100 Series Brochure (PDF)]] | ||
* [ | * [https://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)] | ||
* [ | * [https://w140.com/tek_s-3110_1968_cat.pdf Tektronix S-3110 in 1968 Catalog (PDF)] | ||
* [[Media:070-3065-00.pdf|Automated Measurement Systems: System Calibration Introduction (PDF)]] | * [[Media:070-3065-00.pdf|Automated Measurement Systems: System Calibration Introduction (PDF)]] | ||
* [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf|Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)]] | * [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf|Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)]] | ||
Line 20: | Line 32: | ||
[[Category:Automated test systems]] | [[Category:Automated test systems]] | ||
Revision as of 07:55, 19 August 2021
The Tektronix S-3100 is a family of automated test systems, introduced at WESCON in July 1967.
They use a package consisting of a 568 programmable readout oscilloscope, dual channel vertical sampling plug-ins (3S5/3S6), and delaying sweep time bases (3T5/3T6), plus a digital readout unit (230).
Link
- S-3100 Series Brochure (PDF)
- Tektronix S-3100 in 1968 Catalog (PDF)
- Tektronix S-3110 in 1968 Catalog (PDF)
- Automated Measurement Systems: System Calibration Introduction (PDF)
- Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)
Pictures
-
Photo from 1968 Catalog
-
Block Diagram