Application Notes: Difference between revisions
Jump to navigation
Jump to search
(Added link to "Crystal Device Measurements Using the Spectrum Analyzer" app note.) |
No edit summary |
||
| Line 1: | Line 1: | ||
* [[Media: | * [[Media:AX-3535.pdf|AX-2535: M. Engelson, ''Crystal Device Measurements Using the Spectrum Analyzer'']], 1977 (PDF) | ||
* [[Media:Floating Oscilloscope Measurements 1981.pdf|''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF) ''(→ [[A6902]])'' | |||
* [[Media:Floating Oscilloscope Measurements 1981.pdf|Floating Oscilloscope Measurements 1981 (PDF)]] | * [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR) ''(→ [[7854]])'' | ||
* [[Media:42W-6694.pdf|High Frequency Wafer Probing (PDF, OCR)]] | * [[Media:85W-8885-0.pdf|85W-8885-0: ''TDR Tools in Modeling Interconnects and Packages'']], 1993 (PDF, OCR) | ||
* [[Media:85W-8885-0.pdf|TDR Tools in Modeling Interconnects and Packages (PDF, OCR) | * [[Media:Tek z-profile algorithm.pdf|85W-8882-0: ''Z-Profile Algorithm'']], 1993 (PDF, OCR) | ||
* [[Media:Tek z-profile algorithm.pdf|Z-Profile Algorithm (PDF, OCR) | |||
[[Category:Documentation]] | [[Category:Documentation]] | ||
==="Digital Application Notes"=== | |||
* [[Media:7000 Series Digital Plug-In Applications.pdf|7000 Series Digital Plug-In Applications]], 1977 (PDF, OCR) | |||
* ''(please add)'' Measuring time Interval Between Νοn-Adjacent Digital Word Train Pulses or Multi-Echo Radar Pulses ''(→ [[7D15]])'' | |||
* ''(please add)'' Counting Events in a Burst and Measuring Burst Frequency ''(→ [[7D14]])'' | |||
* ''(please add)'' Digital Delay in an Oscilloscope Makes Your Radar Pulse Time Delay Measurements Quicker, Easier and More Accurate ''(→ [[7D11]])'' | |||
* ''(please add)'' Measuring Memory Core I/Ο Signals with Digital Accuracy ''(→ [[7D12]]//[[M2]], [[7D15]])'' | |||
* ''(please add)'' Measuring Disc Drive Access Time and Access Voltages with Tektronix 7000-Series Digital Plug-ins ''(→ [[7D12]]//[[M2]], [[7D15]])'' | |||
* ''(please add)'' SCR Gating Waveform Measurements with High Resolution Digital Accuracy ''(→ [[7D12]]//[[M2]])'' | |||
* ''(please add)'' Why Use Digital Events in Your Measurement Applications ''(→ [[7D11]])'' | |||
Revision as of 02:43, 12 November 2020
- AX-2535: M. Engelson, Crystal Device Measurements Using the Spectrum Analyzer, 1977 (PDF)
- Floating Oscilloscope Measurements ... And Operator Protection, 1981 (PDF) (→ A6902)
- 42W-6694: High Frequency Wafer Probing, 1987 (PDF, OCR) (→ 7854)
- 85W-8885-0: TDR Tools in Modeling Interconnects and Packages, 1993 (PDF, OCR)
- 85W-8882-0: Z-Profile Algorithm, 1993 (PDF, OCR)
"Digital Application Notes"
- 7000 Series Digital Plug-In Applications, 1977 (PDF, OCR)
- (please add) Measuring time Interval Between Νοn-Adjacent Digital Word Train Pulses or Multi-Echo Radar Pulses (→ 7D15)
- (please add) Counting Events in a Burst and Measuring Burst Frequency (→ 7D14)
- (please add) Digital Delay in an Oscilloscope Makes Your Radar Pulse Time Delay Measurements Quicker, Easier and More Accurate (→ 7D11)
- (please add) Measuring Memory Core I/Ο Signals with Digital Accuracy (→ 7D12//M2, 7D15)
- (please add) Measuring Disc Drive Access Time and Access Voltages with Tektronix 7000-Series Digital Plug-ins (→ 7D12//M2, 7D15)
- (please add) SCR Gating Waveform Measurements with High Resolution Digital Accuracy (→ 7D12//M2)
- (please add) Why Use Digital Events in Your Measurement Applications (→ 7D11)