S-3100: Difference between revisions
Jump to navigation
Jump to search
(Per TekWeek 1967 summary) |
(→Link) |
||
| Line 9: | Line 9: | ||
* [http://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)] | * [http://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)] | ||
* [http://w140.com/tek_s-3110_1968_cat.pdf Tektronix S-3110 in 1968 Catalog (PDF)] | * [http://w140.com/tek_s-3110_1968_cat.pdf Tektronix S-3110 in 1968 Catalog (PDF)] | ||
* [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf|Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)]] | |||
==Pictures== | ==Pictures== | ||
Revision as of 10:00, 17 June 2020
The Tektronix S-3100 is a family of automated test systems, introduced at WESCON in July 1967.
They use a package consisting of a 568 programmable readout oscilloscope, dual channel vertical sampling plug-ins (3S5/3S6), and delaying sweep time bases (3T5/3T6), plus a digital readout unit (230).
Link
- S-3100 Series Brochure (PDF)
- Tektronix S-3100 in 1968 Catalog (PDF)
- Tektronix S-3110 in 1968 Catalog (PDF)
- Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)
Pictures
-
Photo from 1968 Catalog
-
Block Diagram
