S-3100: Difference between revisions
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{{Documents|Link=S-3100}} | {{Documents|Link=S-3100}} | ||
{{Documents|Link=S-3110}} | {{Documents|Link=S-3110}} | ||
{{Documents|Link=S-3150}} | |||
==See Also== | ==See Also== | ||
Revision as of 06:08, 16 November 2023
The Tektronix S-3100 is a family of automated test systems, introduced at WESCON in July 1967.
They use a package consisting of a 568 programmable readout oscilloscope, dual channel vertical sampling plug-ins (3S5/3S6), and delaying sweep time bases (3T5/3T6), plus a digital readout unit (230).
Links
- S-3100 Series Brochure
- Tektronix S-3100 in 1968 Catalog
- Tektronix S-3110 in 1968 Catalog
- Automated Measurement Systems: System Calibration Introduction
- Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual
Documents Referencing S-3100
- (no results)
Documents Referencing S-3110
| Document | Class | Title | Authors | Year | Links |
|---|---|---|---|---|---|
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Automated Measurement Systems | 1970 | S-3150 • 568 • 230 • S-3110 • 241 • 240 | |
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Some Thoughts from a System Builder | Morgan Howells | 1970 | S-3110 • S-3111 • S-3120 • S-3130 • S-3150 |
Documents Referencing S-3150
| Document | Class | Title | Authors | Year | Links |
|---|---|---|---|---|---|
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Automated Measurement Systems | 1970 | S-3150 • 568 • 230 • S-3110 • 241 • 240 | |
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Some Experiences in IC Testing | Oris Nussbaum | 1970 | S-3130 • S-3150 |
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Some Thoughts from a System Builder | Morgan Howells | 1970 | S-3110 • S-3111 • S-3120 • S-3130 • S-3150 |
See Also
- 015-0139-00 input-output panel
Pictures
-
Photo from 1968 Catalog
-
Block Diagram
