Bo Janko

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Bozidar Janko (? – ?)

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Products by Bo Janko

Model Class Description Designers Introduced
R7912 Oscilloscope 500 MHz digitizer Carlo Infante Jim Cavoretto Al Allworth Don Roberts Stu McNaughton Walt Lowy Ray Hayes Ken Hawken Bob Culter Hal Cobb Ed Ritz Bo Janko 1973
7912 Oscilloscope 500/750 MHz digitizer Carlo Infante Jim Cavoretto Al Allworth Don Roberts Stu McNaughton Walt Lowy Ray Hayes Ken Hawken Bob Culter Hal Cobb Ed Ritz Bo Janko 1973
7912AD Oscilloscope 500 MHz digitizer Carlo Infante Jim Cavoretto Al Allworth Don Roberts Stu McNaughton Walt Lowy Ray Hayes Ken Hawken Bob Culter Hal Cobb Ed Ritz Bo Janko 1978
7912HB Oscilloscope 750 MHz digitizer Carlo Infante Jim Cavoretto Al Allworth Don Roberts Stu McNaughton Walt Lowy Ray Hayes Ken Hawken Bob Culter Hal Cobb Ed Ritz Bo Janko 1988

Components by Bo Janko

Model Class Description Designers Used in
T7912 CRT scan converter tube Carlo Infante Ray Hayes Ken Hawken Bob Culter Hal Cobb Ed Ritz Bo Janko R7912 7912AD 7912HB

Patents by Bozidar Janko

Page Office Number Title Inventors Company Filing date Grant date
Patent US 3753129A US 3753129A Stabilization of prepare voltage of transmission storage target Bozidar Janko Tektronix Inc 1972-01-24 1973-08-14
Patent US 3849695A US 3849695A Distributed deflection structure employing dielectric support Richard Elliot Piazza Bozidar Janko Tektronix Inc 1973-07-19 1974-11-19
Patent US 4075533A US 4075533A Electron beam forming structure utilizing an ion trap Bozidar Janko Tektronix Inc 1976-09-07 1978-02-21
Patent US 4137479A US 4137479A Cathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lens Bozidar Janko Tektronix Inc 1977-01-06 1979-01-30
Patent US 4110749A US 4110749A Touch display to digital encoding system Bozidar Janko Aris Silzars Tektronix Inc 1977-05-06 1978-08-29
Patent US 4207492A US 4207492A Slow-wave high frequency deflection structure William H. Tomison Bozidar Janko Myron A. Bostwick Jr. Aris Silzars Tektronix Inc 1978-08-07 1980-06-10
Patent US 4188563A US 4188563A Cathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lens Bozidar Janko Tektronix Inc 1978-08-31 1980-02-12
Patent US 4277722A US 4277722A Cathode ray tube having low voltage focus and dynamic correction Ken Hawken Bozidar Janko Tektronix Inc 1979-05-14 1981-07-07
Patent CA 1112283A CA 1112283A Quadrupole lens having interdigitated lobes on adjacent tubular members Bozidar Janko Tektronix Inc 1980-07-31 1981-11-10
Patent US 4623819A US 4623819A Accelerating and scan expansion electron lens means for a cathode ray tube Bozidar Janko Norman R. Franzen Myron A. Bostwick Jr. Tektronix Inc 1985-08-12 1986-11-18
Patent US 4891585A US 4891585A Multiple lead probe for integrated circuits in wafer form Bozidar Janko Kenneth R. Smith Tektronix Inc 1986-09-05 1990-01-02
Patent US 4950981A US 4950981A Apparatus for testing a circuit board Bozidar Janko Tektronix Inc 1989-04-14 1990-08-21
Patent US 4963821A US 4963821A Probe and method for testing a populated circuit board Bozidar Janko Zoran O. Sekulic Mark F. Bitetto Tektronix Inc 1989-04-14 1990-10-16
Patent US 5015946A US 5015946A High density probe Bozidar Janko Tektronix Inc 1990-02-26 1991-05-14
Patent US 5166609A US 5166609A Adapter and test fixture for an integrated circuit device package Paul A. Cole Bozidar Janko Richard G. Chambers Wolfgang H. Herr Douglas W. Trobough Peter M. Compton Tektronix Inc 1990-05-24 1992-11-24
Patent US 5202622A US 5202622A Adapter and test fixture for an integrated circuit device package Paul A. Cole Bozidar Janko Richard G. Chambers Wolfgang H. Herr Douglas W. Trobough Peter M. Compton Tektronix Inc 1991-06-24 1993-04-13
Patent US 5221895A US 5221895A Probe with microstrip transmission lines Bozidar Janko Val Garuts J. Lynn Saunders Tektronix Inc 1991-12-23 1993-06-22
Patent US 5321365A US 5321365A Reduced noise sensitivity in inverse scattering through filtering Scott K. Diamond Steven H. Pepper Bozidar Janko Tektronix Inc 1993-03-03 1994-06-14
Patent US 5818520A US 5818520A Programmable instrument for automatic measurement of compressed video quality Bozidar Janko David K. Fibush Tektronix Inc 1996-02-12 1998-10-06
Patent US 5940124A US 5940124A Attentional maps in objective measurement of video quality degradation Bozidar Janko John W. Edwards Tektronix Inc 1997-07-18 1999-08-17
Patent US 6075561A US 6075561A Low duty-cycle transport of video reference images Bozidar Janko Tektronix Inc 1998-02-20 2000-06-13
Patent US 6795580B1 US 6795580B1 Picture quality measurement using blockiness Bozidar Janko Steven D. Maurer Tektronix Inc 1998-09-10 2004-09-21
Patent EP 0938239A1 EP 0938239A1 Low duty-cycle transport of video reference images Bozidar Janko Tektronix Inc 1999-01-27 2002-07-10
Patent US 6377297B1 US 6377297B1 Detection of repeated and frozen frames in a video signal Bozidar Janko Kamalesh Patel Tektronix Inc 1999-12-07 2002-04-23
Patent US 6433819B1 US 6433819B1 Detection of Gaussian noise in video signals Bei Li Bozidar Janko Tektronix Inc 1999-12-07 2002-08-13
Patent US 6437821B1 US 6437821B1 Harmonic measurement of blockiness in video signals Bozidar Janko John Raitz Tektronix Inc 1999-12-22 2002-08-20
Patent US 6690840B1 US 6690840B1 Image alignment with global translation and linear stretch Bozidar Janko Shane Ching-Feng Hu Tektronix Inc 2000-02-08 2004-02-10
Patent US 6671409B1 US 6671409B1 Blockiness period detection of DCT-based codecs Steven D. Maurer Bozidar Janko Tektronix Inc 2000-03-03 2003-12-30
Patent EP 1107604A2 EP 1107604A2 Detection of repeated and frozen frames in a video signal Bozidar Janko Kamalesh Patel Tektronix Inc 2000-11-28 2005-03-16
Patent US 6633329B2 US 6633329B2 Frozen field detection of formerly encoded video Bozidar Janko Steven D. Maurer Tektronix Inc 2001-02-06 2003-10-14
Patent US 7061920B2 US 7061920B2 Streaming media quality analyzer system Bozidar Janko Kevin M. Ferguson Gale L. Straney George M. Williams Tektronix Inc 2001-04-17 2006-06-13
Patent US 7773112B2 US 7773112B2 Automatic measurement of video parameters Justin F. Whitling Bozidar Janko Kathryn A. Engholm Frederick A. Azinger Tektronix Inc 2002-08-20 2010-08-10