S-3260
The Tektronix S-3260 Automated Test System is a programmable real-time semiconductor test system which uses single-shot measurement techniques under software control of a dedicated computer (a DEC PDP-11/40).
Its test station contains 64 input/output sector cards to connect to as many device pins. A relay matrix allows each pin of the DUT to be connected to a parametric measurement system consisting of time interval measurement and DC measurement subsystems.
Key Specifications
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Links
Documents referencing S-3260
| Document | Class | Title | Authors | Year | Links |
|---|---|---|---|---|---|
| Tekscope 1973 V5 N1 Jan 1973.pdf | Article | TekTest III | W.E.Kehret | 1973 | S-3260 |
Background
TekWeek 4/26/1974 says,
An idea born in Paris four years ago has grown into an important new Tektronix product. It's the S-3260 Automated Test System providing an integrated three-way testing cараbility. In physical size, the S-3260 is Tek's largest and most expensive product.
Development began in April, 1970, when Al Zimmerman, Systems Engineering manager, returned from a seminar in Paris at which representatives of integrated circuit manufacturers throughout the world exchanged papers. (Al presented a paper on Tek's S-3150.)
At Paris Al realized the manufacturers needed a test system with greater flexibility and higher speeds than was available at that time. They asked for a product with clock rates to 20 MHz and a combined measurement capability embracing parametric (DC) measurements, functional (truth-table) tests and dynamic (timing) measurements. Back in Beaverton, Al developed the concept of the S-3260 and worked out the design planning with several engineers in his group.
Early in 1971, with a firm concept of the tester, and corporate approval in hand, engineering work began on the 1803 test station and the R2941 clock generator. Design of the software got underway later in the year in cooperation with Applied Theory Associates of Corvallis.
Test systems then on the market had one or two capabilities, but none with the measurement flexibility featured in the S-3260. Control of the S-3260 is with the most advanced minicomputer available.
Software with the S-3260 has been given the registered trademark, "TEKTEST III." It was designed from the ground up for high speed production testing, and is a true compiler type of operating system. The TEKTRONIX 4010 Display Unit is standard with the S-3260. It is used for test-program writing and graphic display of test results. The S-3260 was developed through team efforts in circuit design, mechanical design, software development, etched circuit layout, prototype construction, instrument evaluation and manuals development.
Nippon Telegraph and Telephone received the first S-3260. It was shipped to company headquarters in Tokyo where it is now testing semiconductor components.
S-3260's have been delivered to several large U.S. companies and governmental agencies, including NASA, Western Electric, General Electric, Hughes Aircraft, and TRW. Ellemtel in Sweden will soon receive the first European installation. Interest in the S-3260 has brought a large number of potential customers to Beaverton to inspect the product, to see demonstrations of both hardware and software, and to discuss technical requirements. "Development of the S-3260 has been truly a team accomplishment," Al said, "and many other employees have assisted with special talents in many ways. An extra vote of thanks is due to the understanding families of those who have spent many evenings and weekends at work on this project."
See Also
- 015-1041-00
- 015-0289-00
- 1140A Programmable Power Supply
- 1340 Data Coupler
- 1803 Test Station
- 2941 Programmable Multiphase Clock Generator
Pictures
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Tek S-3260/80
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Tektronix 3260 Architecture
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Tek S3260 Team
