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S-20: Difference between revisions
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[[John Rettig]] wrote this general description: | [[John Rettig]] wrote this general description: | ||
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This device, the SD-20, and for that matter the [[S-6]] of the 7K generation all suffered from customer inattention to ESD issues - there were a lot of repairs needed. As a result, our 8000-series never included a loop through feature, although we do support high BW [[TekConnect_connector|TekConnect]] probes through the [[80A03]]. And furthermore, all of our samplers now run open loop, with on-the-fly point correction for the front end nonlinearity, so there is no loop gain correction needed. | This device, the SD-20, and for that matter the [[S-6]] of the 7K generation all suffered from customer inattention to ESD issues - there were a lot of repairs needed. As a result, our 8000-series never included a loop through feature, although we do support high BW [[TekConnect_connector|TekConnect]] probes through the [[80A03]]. And furthermore, all of our samplers now run open loop, with on-the-fly point correction for the front end nonlinearity, so there is no loop gain correction needed. | ||
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Abbreviations: | Abbreviations: | ||