Application Notes: Difference between revisions
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* [[Media:42W-5334.pdf|42W-5334: ''Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In'']], 1983 (PDF, OCR) ''(→ [[7854]] [[7S12]])'' | * [[Media:42W-5334.pdf|42W-5334: ''Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In'']], 1983 (PDF, OCR) ''(→ [[7854]] [[7S12]])'' | ||
* [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR) ''(→ [[7854]])'' | * [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR) ''(→ [[7854]])'' | ||
* [[Media:Floating Oscilloscope Measurements 1981.pdf|60AX-4741: ''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF) ''(→ [[A6902]])'' | * [[Media:Floating Oscilloscope Measurements 1981.pdf|60AX-4741: ''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF) ''(→ [[A6901]] [[A6902]] [[221]])'' | ||
* [[Media:85W-8885-0.pdf|85W-8885-0: ''TDR Tools in Modeling Interconnects and Packages'']], 1993 (PDF, OCR) | * [[Media:85W-8885-0.pdf|85W-8885-0: ''TDR Tools in Modeling Interconnects and Packages'']], 1993 (PDF, OCR) | ||
* [[Media:Tek z-profile algorithm.pdf|85W-8882-0: ''Z-Profile Algorithm'']], 1993 (PDF, OCR) | * [[Media:Tek z-profile algorithm.pdf|85W-8882-0: ''Z-Profile Algorithm'']], 1993 (PDF, OCR) | ||
Revision as of 20:38, 20 November 2020
- AX-3079: Television Products App Note no. 17, The Auxiliary Video Facility of the 1480-Series of Waveform Monitors, 1974 (PDF) (→ 1480)
- AX-3106: Television Application Note no. 19, Vertical Interval Test Signals - Reprogramming Tektronix Signal Generators, 1975 (PDF) (→ 147 149 1440)
- AX-3535: M. Engelson, Crystal Device Measurements Using the Spectrum Analyzer, 1977 (PDF)
- AX-3607: S. C. Baunach, An Example of an M6800-Based GPIB Interface, 1977 (PDF)
- 26AX-3582-3: Clifford B. Schrock, FM Broadcast Measurements Using the Spectrum Analyzer, 1981 (PDF) (→ 7L12 7K11 5L4N SG502)
- 26W-4889: No Loose Ends - Revised - The Tektronix Proof-of-Performance Program for CATV, 1982 (PDF) (→ 7L12 7L14 147 1430)
- 42W-5334: Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In, 1983 (PDF, OCR) (→ 7854 7S12)
- 42W-6694: High Frequency Wafer Probing, 1987 (PDF, OCR) (→ 7854)
- 60AX-4741: Floating Oscilloscope Measurements ... And Operator Protection, 1981 (PDF) (→ A6901 A6902 221)
- 85W-8885-0: TDR Tools in Modeling Interconnects and Packages, 1993 (PDF, OCR)
- 85W-8882-0: Z-Profile Algorithm, 1993 (PDF, OCR)
"Digital Application Notes"
- 7000 Series Digital Plug-In Applications, 1977 (PDF, OCR)
- 42W-5017: Increased Measurement Accuracy Using a 7D15 Universal Counter/Timer in Any 7000 Series Oscilloscope, 1982 (PDF) (→ 7D15)
- (please add) Measuring time Interval Between Νοn-Adjacent Digital Word Train Pulses or Multi-Echo Radar Pulses (→ 7D15)
- (please add) Counting Events in a Burst and Measuring Burst Frequency (→ 7D14)
- (please add) Digital Delay in an Oscilloscope Makes Your Radar Pulse Time Delay Measurements Quicker, Easier and More Accurate (→ 7D11)
- (please add) Measuring Memory Core I/Ο Signals with Digital Accuracy (→ 7D12//M2, 7D15)
- (please add) Measuring Disc Drive Access Time and Access Voltages with Tektronix 7000-Series Digital Plug-ins (→ 7D12//M2, 7D15)
- (please add) SCR Gating Waveform Measurements with High Resolution Digital Accuracy (→ 7D12//M2)
- (please add) Why Use Digital Events in Your Measurement Applications (→ 7D11)