155-0078-00

The 155-0078-xx (M084) is a Tek-made broadband vertical amplifier integrated circuit in a minipac package. The input and output are differential. The 155-0078 and its test fixture were designed by John Addis for the 485 scope ^{(Note 1)}, which uses no less than 18 of these chips in various grades.

The rise time of each M84 was tested using the 25ps Push-Pull Pulse Generator, and parts were binned and were given part numbers with an appropriate speed suffix. Each M84 was also tested for DC characteristics such as balance.

The last two digits of the 155-0078-xx part number are determined by a selection process after manufacture. These characteristics are summarized below:
SUFFIX	SPEED	DC CHARACTERISTICS	REPLACEABLE BY
00	Fast	Best	----
01	Fast	Third best	-03,-00
02	Fast	Most relaxed	-01,-03,-00
03	Fast	Second best	-00
04	Slow	Same as -00	-00
05	Slow	Same as -01	-03,-00,-07,-04
06	Slow	Same as -02	-01,-03,-00,-05,-07,-04
07	Slow	Same as -03	-00,-04
10	Fast	Best	----
11	Fast	Third best	-13,-10
12	Fast	Most relaxed	-11,-13,-10
13	Fast	Second best	-10
Sometimes an instrument will contain a better grade of part than called for in the manual. The manual should be consulted for the correct replacement type.

The M84 also comes in 14-pin DIP, as 155-0273-00 and 155-0274-00 (slower grade).

Regarding the various grades of M84, John Addis says:

There are several DC specs which differ with part suffix.
Suffixes -10, -11, -12 and -13 were used with the redesigned M84, known as the M705. The M705 was necessary because the original SH2 (2-2.5GHz?) process was being discontinued. The M705 was designed by Hal Lilliwhite using the faster SH3 process (6-7GHz). Additionally, the M705 apparently had the gain setting resistor laser trimmed at the wafer level. The M705 was designed in late 1989 and tested in early 1990.
There are two test fixtures and every M84 was subjected to all tests on each test fixture, and all tests were done manually. I designed both test fixtures and the 25ps PPPG.
Transient Response (schematic not shown) uses 25ps Push Pull Pulse Generator (PPPG) and a sampling scope. Sampler load supplies dc current (through X2 pads and sampler input resistance. The sampling scope chassis is floating at (probably) +5V through 8.2 ohms. 25ps PPPG has transformer coupled trigger output to sampling scope trigger input.
DC test fixture:
I have attached a schematic of a dc test fixture for manufacturing. It looks like this fixture only tests for V_hump. There may have been another test fixture for the other dc tests. Those tests may have been done on a system. The V_hump test may have been so difficult to perform on an automated system that it needed this extra fixture.
V_hump is the amount of maximum dc imbalance, probably referred to the input, which occurs when the variable gain function is swept from full invert to full normal. I think that the two ends of the curve are set to the same dc output level. Ideally, there is no change in dc level under these conditions, but various imbalances in the M84 output devices result in a hump for inverted gain and a hump for the normal gain. Only the -00, -04 and -10 suffixed parts were required to pass this stringent V_hump test. The fixture was in a rubber footed metal chassis about 4” high 5” deep, and 7” wide.