Larry Lockwood: Difference between revisions
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Revision as of 03:23, 13 March 2022
Larry R. Lockwood (? – ?)
Please add referenced biography.
Products by Larry Lockwood
| Manufacturer | Model | Description | Designers | Introduced |
|---|---|---|---|---|
| Tektronix | 7L12 | 1.8 GHz Spectrum Analyzer | Morris Engelson • Linley Gumm • Gene Kauffman • Larry Lockwood • Gordon Long • Steve Morton • Paul Parks • Fred Telewski • Neal Broadbent • Jack Doyle • Al Huegli • Steve Skidmore • Leighton Whitsett • Judy Hanson • Robert Holmes • Carolyn Moore • Rena Randle | 1971 |
| Tektronix | 492 | 21 GHz Spectrum Analyzer | Larry Lockwood • Steve Morton • Linley Gumm • Robert Alm • Bob Bales • Carlos Beeck • Bill Benedict • Craig Bryant • Russell Brown • Wes Hayward • David Leatherwood • Gordon Long • Dave Morton • Bill Peterson • David Shores • Steve Skidmore • Dennis Smith • Phil Snow • Leighton Whitset • Norman Witt | 1980 |
Components by Larry Lockwood
Patents by Larry Lockwood
| Page | Office | Number | Title | Inventors | Company | Filing date | Grant date |
|---|---|---|---|---|---|---|---|
| Patent US 3646456A | US | 3646456A | Logarithmic amplifier | Gene Kauffman • Larry Lockwood | Tektronix Inc | 1970-07-09 | 1972-02-29 |
| Patent US 3760283A | US | 3760283A | Sampling device | Larry Lockwood | Tektronix Inc | 1971-08-23 | 1973-09-18 |
| Patent US 4450422A | US | 4450422A | Electronic filter devices | Larry Lockwood | Tektronix Inc | 1982-09-28 | 1984-05-22 |
| Patent US 4575699A | US | 4575699A | Dielectric resonator frequency selective network | Larry Lockwood | Tektronix Inc | 1984-11-23 | 1986-03-11 |
| Patent US 4580109A | US | 4580109A | Low noise oscillator | Larry Lockwood | Tektronix Inc | 1984-11-23 | 1986-04-01 |
| Patent US 4670723A | US | 4670723A | Broad band, thin film attenuator and method for construction thereof | Leonard A. Roland • Larry Lockwood • Heinz Erwin Grellmann | Tektronix Inc | 1985-03-18 | 1987-06-02 |
| Patent US 4654600A | US | 4654600A | Phase detector | Larry Lockwood | Tektronix Inc | 1985-08-30 | 1987-03-31 |
| Patent US 6246717B1 | US | 6246717B1 | Measurement test set and method for in-service measurements of phase noise | Xiaofen Chen • Linley Gumm • Dana E. Whitlow • Larry Lockwood | Tektronix Inc | 1998-11-03 | 2001-06-12 |