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{{Spec | Trigger delay | 0-65535 clock periods }}
{{Spec | Trigger delay | 0-65535 clock periods }}
{{Spec | Serial data | 5, 6, 7 or 8 bits per character, asynchronous (50, 75, 110, 134.5, 150, 200, 300, 600, 1200, 1900, 2400, 4800 or 9600 bits/s or external up to 9600 bits/s) or synchronous up to 9600 bits/s }}
{{Spec | Serial data | 5, 6, 7 or 8 bits per character, asynchronous (50, 75, 110, 134.5, 150, 200, 300, 600, 1200, 1900, 2400, 4800 or 9600 bits/s or external up to 9600 bits/s) or synchronous up to 9600 bits/s }}
{{Spec | Signature analysis | 20 MHz via serial probe input (data) and P6451 (0 start, 1 stop, C clock) }}
{{Spec | Signature analysis | 20 MHz via serial probe input (data) and P6451 (0 start, 1 stop, C clock); up to 8 recent signatures displayed  }}
{{SpecGroup | Display }}
{{SpecGroup | Display }}
{{Spec | CRT | [[154-0814-00]], 6.8 cm × 5.4 cm, P4 phosphor (white) }}
{{Spec | CRT | [[154-0814-00]], 6.8 cm × 5.4 cm, P4 phosphor (white) }}
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* [https://www.radiomuseum.org/r/sonytek_data_analyzer_308.html Tek 308 @ radiomuseum.org]
* [https://www.radiomuseum.org/r/sonytek_data_analyzer_308.html Tek 308 @ radiomuseum.org]
{{Documents|Link=308}}
{{Documents|Link=308}}
{{PatentLinks|308}}


==Internals==
==Internals==

Latest revision as of 05:13, 14 October 2024

Sony/Tektronix 308
20 MHz 8-ch Logic Analyzer
Sony/Tektronix 308

Produced from 1980 to 1986

Manuals

ROM images

(All manuals in PDF format unless noted otherwise)
Manuals – Specifications – Links – Pictures

The Sony/Tektronix 308 is a portable 8-channel, 20 MHz "data analyzer" (logic analyzer) with parallel timing, parallel state, serial (up to 9600 bps) and signature analysis modes.

The 308 uses two probes, the standard P6451 8-channel + clock data acquisition probe, and the optional 16-channel P6406 word recognizer probe. Both use 012-0747-00 cable harnesses to attach to the data source.

Key Specifications

     — Inputs —
Data Eight data channels + 1 clock channel (P6451 probe), impedance 1 MΩ // 5 pF, max. ±40 V nondestructive, logic threshold fixed 1.4 V (TTL) or variable from −12 V to +12 V
Word recognizer Sixteen TTL inputs (+40/−400 μA max.), max. +15/−1 V
Serial BNC connector, 1 MΩ // 40 pF, max. ±250 V on BNC; used with P6107 probe, 10 MΩ // 13 pF, max. ±500 V
Qualifier BNC connector, 10 kΩ, max. +10/−5 V
     — Acquisition —
Clock 50 ns to 200 ms per sample (1-2-5 sequence) or external down to 50 ns
Timing Data setup time min. 25 ns, hold time min. 0 ns
Memory 2 × 252 eight-bit words (acquisition + reference)
Trigger mode PRE (trigger at memory location 240) or POST (location 13)
Trigger delay 0-65535 clock periods
Serial data 5, 6, 7 or 8 bits per character, asynchronous (50, 75, 110, 134.5, 150, 200, 300, 600, 1200, 1900, 2400, 4800 or 9600 bits/s or external up to 9600 bits/s) or synchronous up to 9600 bits/s
Signature analysis 20 MHz via serial probe input (data) and P6451 (0 start, 1 stop, C clock); up to 8 recent signatures displayed
     — Display —
CRT 154-0814-00, 6.8 cm × 5.4 cm, P4 phosphor (white)
     — General —
Power 90-132 V or 180-250 V, 48-440 Hz
Weight 3.7 kg (8.16 lb)

Links

Documents Referencing 308

Document Class Title Authors Year Links
Tekscope 1980 V12 N1.pdf Article New Products 1980 308 • SG505 • 8002A
Tekscope 1980 V12 N2.pdf Article Portable Analyzer Speeds Test and Service of Microprocessor-Based System Ed Averill • John Huber 1980 308

Patents that may apply to 308

Page Title Inventors Filing date Grant date Links
Patent US 3976864A Apparatus and method for testing digital circuits Gary B. Gordon • George A. Haag • Jan R. Hofland • Daniel I. Kolody 1974-09-03 1976-08-24 Signature analysis • 308 • SA501

Internals

The 308 is built around an Intel 8085A microprocessor. The display is a magnetically deflected raster-scan CRT. The only Tek-specific IC in the 308 is a 155-0067-02 SMPS controller.

Pictures

  • 308 display, timing mode (binary counter example)

    308 display, timing mode (binary counter example)

  • 308 display, state mode (binary counter example)

    308 display, state mode (binary counter example)

Internals

  • Top left

    Top left

  • Top right

    Top right

  • Top right (2)

    Top right (2)

  • Boards unfolding

    Boards unfolding

  • Boards unfolding (2)

    Boards unfolding (2)

  • Input board

    Input board

  • Trigger board

    Trigger board

  • back side of input and trigger boards

    back side of input and trigger boards

  • Signature/Serial board

    Signature/Serial board

  • CPU board

    CPU board

  • CRT module

    CRT module

  • Power supply, top

    Power supply, top

  • Power supply, bottom

    Power supply, bottom

  • Internal side of the power supply

    Internal side of the power supply

  • Internal side of the power supply

    Internal side of the power supply

  • Bottom (CRT board and card cage)

    Bottom (CRT board and card cage)

  • Bottom CRT board SN303537-UP

    Bottom CRT board SN303537-UP

Probes

  • P6451 probe

    P6451 probe

  • P6451 probe

    P6451 probe

  • P6451 probe internal, PCB front

    P6451 probe internal, PCB front

  • P6451 probe internal, PCB back

    P6451 probe internal, PCB back

  • P6406 word recognizer probe

    P6406 word recognizer probe

  • P6406 case close-up

    P6406 case close-up

  • P6406 PCB front

    P6406 PCB front

  • P6406 PCB back

    P6406 PCB back

  • Using P64xx probes with jumper wires

    Using P64xx probes with jumper wires

Components

Some Parts Used in the 308

Part Part Number(s) Class Description Used in
154-0814-00 154-0814-00 CRT CRT 308
155-0067-02 155-0067-00 • 155-0067-02 • 155-0067-03 Monolithic integrated circuit SMPS controller 7704A • 7834 • 7844 • 7854 • 7904 • R7903 • 7904 • 7904A • 7934 • R7912 • 7912AD • 7912HB • 7934 • 7104 • R7103 • 308 • 434 • 485 • 690 • P7001
2316E Monolithic integrated circuit 2K×8 ROM 308
2364 Monolithic integrated circuit 8K×8 ROM 308
Intel 8085A 156-1088-00 Monolithic integrated circuit 8-bit microprocessor 308 • 468 • 4025 • 7A42 • 7D02 • AFG5101 • AFG5102 • PFG5105


Patents that may apply to 308

Page Title Inventors Filing date Grant date Links
Patent US 3976864A Apparatus and method for testing digital circuits Gary B. Gordon • George A. Haag • Jan R. Hofland • Daniel I. Kolody 1974-09-03 1976-08-24 Signature analysis • 308 • SA501
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