Application Notes

App Note	Title	Author	Year	Instruments Referenced
AX-3079	The Auxiliary Video Facility of the 1480-Series of Waveform Monitors (TV Products App Note No.17)		1974	1480
AX-3106	Vertical Interval Test Signals - Reprogramming Tektronix Signal Generators (TV Products App Note No.19)		1975	147, 149, 1440
AX-3107	The Tektronix Cookbook of Standard Audio Tests using the 5L4N Low Frequency Spectrum Analyzer	Clifford B. Schrock	1979	5L4N
AX-3197-1	Testing Optoisolators		1978
AX-3264	A New NTSC Graticule for the 1480 Waveform Monitor (TV Products App Note No.20)		1975	1480
AX-3265	Shortening the Blanking Intervals of the Tektronix 140-144-146 NTSC Generators (TV Products App Note No.22)		1976	140, 144, 146
AX-3388	Multiburst Testing with the 1470 (TV Products App Note No.23)	Stu Rasmussen	1976	1470
AX-3406-1	EMI Applications Using the Spectrum Analyzer	Morris Engelson	1979	7L5
AX-3524	Troubleshooting a Microprocessor (Logic Analyzer App Note #57K1.0)		1977	7D01, DF1
AX-3535	Crystal Device Measurements Using the Spectrum Analyzer	Morris Engelson	1977	7L5
AX-3607	An Example of an M6800-Based GPIB Interface	S. C. Baunach	1977
AX-3957	X-Y Displays with Interval Timing for Measuring SOA		1979	7D15, 7A17
AX-4281	Measurement Variety. An Engineering Challenge Featuring the 7854.		1981	7854

• 26AX-3582-3: Clifford B. Schrock, FM Broadcast Measurements Using the Spectrum Analyzer, 1981 (→ 7L12, 7K11, 5L4N SG502)
• 03W-8605-3: XYZs of Oscilloscopes – Primer, 2009
• 20W-7076: Using the Multipulse Waveform to Measure Group Delay and Amplitude Errors, 1991 (→ 1910)
• 26W-4889: No Loose Ends - Revised - The Tektronix Proof-of-Performance Program for CATV, 1982 (→ 7L12 7L14 147 1430)
• 26W-5360: Bill Benedict, Fundamentals of Spectrum Analysis, 1983 (PDF)
• 26W-5390: Bob Alm and Len Garrett, Spectrum Analysis utilizing Waveguide Mixers, 1983 (→ WM490 )
• 26W-5653: 7854 with spectrum analyzer plugins (please add)
• [[Media:26W-7045.pdf|26W-7045: Morris Engelson, Random Noise Measurement with the Spectrum Analyzer]], 1989 (→ 2710, 2754P)
• 37W-7655: Scope Evaluation Guide & Circuit Board Instructions, 1989 (PDF)
• 37W-60373-0: USB Spectrum Analyzers and SignalVu-PC – Frequently Asked Questions, 2016
• 42AX-4682: Introduction to 7854 Oscilloscope Measurement and Programming Techniques, 1981 (→ 7854)
• 42W-5017: Increased Measurement Accuracy Using a 7D15 Universal Counter/Timer in any 7000 Series Oscilloscope (→ 7D15)
• 42W-5334: Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In, 1983 (→ 7854 7S12)
• 42W-5700: Power Supply/Device Testing, 1984 (→ 7854)
• 42W-6694: High Frequency Wafer Probing, 1987 (→ 7854)
• 51W-10798-1: Power-Electronics Measurements Made Easy with TDS Oscilloscopes, 1996
• 60AX-4741: Floating Oscilloscope Measurements ... And Operator Protection, 1981 (→ A6901 A6902 221)
• 60W-6053: Les Hurlock, The ABCs of Probes, 1986
• 60W-6053-8: ABCs of Probes – Primer, 2003
• 85W-8885-0: TDR Tools in Modeling Interconnects and Packages, 1993
• 85W-8882-0: Z-Profile Algorithm, 1993
• 2EW-8380-1: Spectrum Analyzer Fundamentals, 1993
• 2EW-10598-0: Cable TV Measurements Using the 2714/2715 Spectrum Analyzers, 1995 (→ 2714, 2715)

"Digital Application Notes"

• 7000 Series Digital Plug-In Applications, 1977
• 42W-5017: Increased Measurement Accuracy Using a 7D15 Universal Counter/Timer in Any 7000 Series Oscilloscope, 1982 (→ 7D15)
• (please add) Measuring time Interval Between Νοn-Adjacent Digital Word Train Pulses or Multi-Echo Radar Pulses (→ 7D15)
• (please add) Counting Events in a Burst and Measuring Burst Frequency (→ 7D14)
• (please add) Digital Delay in an Oscilloscope Makes Your Radar Pulse Time Delay Measurements Quicker, Easier and More Accurate (→ 7D11)
• (please add) Measuring Memory Core I/Ο Signals with Digital Accuracy (→ 7D12//M2, 7D15)
• (please add) Measuring Disc Drive Access Time and Access Voltages with Tektronix 7000-Series Digital Plug-ins (→ 7D12//M2, 7D15)
• (please add) SCR Gating Waveform Measurements with High Resolution Digital Accuracy (→ 7D12//M2)
• (please add) Why Use Digital Events in Your Measurement Applications (→ 7D11)